Partner William L. Charron, co-chair of the firm’s Art Law Group, will be speaking at the Authentication in Art (AiA) Congress to be held at the Louwman Museum in The Hague, the Netherlands. Pryor Cashman is a co-sponsor of the event, together with Aris Title Corporation, Bonhams, Louwman Museum, several private art dealers and the municipality of The Hague. Charron will discuss the proposed New York law legislation on the protection of experts, as well as other initiatives emerging in the art market to help address the problem of fakes and forgeries. Charron will additionally present an update on the status of the Knoedler case proceedings in the New York Federal Court. The AiA Congress will be held on May 11-13, 2016, commencing at 9:00 a.m.

Topics to be discussed during the Congress include:

• Reviewing AiA 2012 -2014: The lessons learned from the previous editions will be reviewed, as well as the impact the 2014 Guidelines on Art & Law and Catalogue Raissoné have had on the field.
• Education: One of the main topics of the 2016 AiA Congress is education. Speakers from different regions have been invited to talk about new methods and structures within their education on authenticity. Besides several papers on the topic, the Scientific Workgroup on Education will present their initial version of the 2016 AiA Guidelines on Education, the definitive version being published after the Congress.
• Technical Art History: Another important topic is Technical Art History. Due to the lack of a unified standard within technical research in art, there is a lot of uncertainty. To address this problem, several leading scientists have been invited to talk about the possibilities and ideal form of technical research.
• E-Related Initiatives: Over the past few years, there has been a strong rise in digital activities in the art world such as online auctioneering, digital catalogue raissonés and even online authentication services. This new and important part of the field will be addressed.

For more information and to register, please click here.